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The test methods described can be used to demonstrate the effectiveness of the static control methods
The scope of this Standard lists the proposed impurity limits of trans 1
packaged devices in back end processing where charged device model (CDM) sensitivity may be a problem
ユーザが装置の設計情報を利用できるようにすること，ただしその機密情報が漏洩されないようにすること。
SEMI E133-1110 (technical revision)
D02400 - SEMI D24 - Specification for Glass Substrates Used to Manufacture Flat Panel Displays Revision:SEMI D24-0200 - Superseded The test methods described canThis Standard was technically approved by the Flat Panel Display Factory Automation Global Technical Committee. This edition was approved for publication by the global Audits and Reviews Subcommittee on May 16, 2006. Available at www. semiviews. org and www. semi. org in July 2006; originally published February 2000. NOTICE: This Standard or Safety Guideline has an Inactive Status because the conditions to maintain Current Status have not been met.