MS00700 - SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages Revision:SEMI MS7-0708 - Inactive SEMI E133-1109 (technical revision)

SEMI E133-1109 (technical revision)

This Specification defines the test method for determination of extractable trace contaminants in molding compound

SEMI S2-0715a (delayed revision)

Precision statements have been established for each in the case of the five-point method applied to flatted wafers

This Standard defines three methods for testing chemical durability of various flat panel display substrates: (Method A) Weight Loss

MS00700 - SEMI MS7 - Specification for Microfluidic Interfaces to Electronic Device Packages Revision:SEMI MS7-0708 - Inactive SEMI E133-1109 (technical revision)This standard was technically approved by the global MEMS Committee. This edition was approved for publication by the global Audits & Reviews Subcommittee on May 13, 2008. It was available at www. semi. org in June 2008. This document defines an industry standard for fluidic interfaces with electronic devices. The specification describes the connection attributes and specifies the interface dimensions required to design and build devices and systems